Materials science tools
Crystals, strength tests, microscopy and semiconductors. 23 free tools, with no sign-up. Nothing you enter leaves your device.
Crystallography 4
- XRD peak calculatorTurn powder X-ray diffraction peaks into d-spacings, crystallite sizes (Scherrer, with the instrument's width taken away), size and microstrain from a Williamson-Hall plot, and a cubic lattice (simple, body-centred, face-centred or diamond) with its lattice parameter. Type peaks or open a 2θ scan and let the page find and fit them. #842
- CIF viewerOpen a Crystallographic Information File (CIF) and see the unit cell in 3D: the symmetry operations fill the cell from the listed atoms, and the page gives bond lengths and coordination, the cell volume, the formula and formula units Z, and the density. The file never leaves your browser. #843
- Miller index calculatorWork out the spacing of any (hkl) plane in cubic, tetragonal, orthorhombic, hexagonal, trigonal, monoclinic or triclinic cells, the angle between two planes, their zone axis and the 2θ of each, convert to and from four-index Miller-Bravais notation, list reflections, and see the planes drawn in the unit cell. #844
- Electron diffraction indexerIndex TEM and SAED patterns in the browser: the relativistic electron wavelength and camera constant λL, calibration with rings of a known standard, d-spacings from ring radii or spot distances, ring-ratio indexing of cubic lattices with the lattice parameter, and the zone axis of a two-spot pattern. #845
Mechanical behaviour 5
- Stress-strain curve analyserPaste or open force-extension or stress-strain data from a tensile test. Get Young's modulus from a straight-line fit, the 0.2 % offset yield strength, tensile strength, uniform and fracture elongation, toughness, resilience, true stress-strain to the UTS and the strain-hardening exponent, with a plot and CSV. #846
- Fatigue S-N calculatorPaste or open stress-life (S-N) test results and fit Basquin's law on log-log axes, with run-outs left out. Estimate the endurance strength, correct for mean stress with Goodman, Gerber, Soderberg or Morrow on a Haigh diagram, and add up fatigue damage for a load spectrum with Miner's rule. #847
- Fracture toughness calculatorWork out the stress intensity K = Yσ√(πa) for centre, edge, double-edge and buried cracks, with finite-width corrections. Get the critical stress and critical crack size against K_IC, the ASTM E399 plane-strain size check, the plastic zone, and the fatigue crack growth life from Paris' law. #848
- Larson-Miller creep calculatorPaste or open creep-rupture tests (temperature, stress, hours) and fit a Larson-Miller master curve with C = 20 or your own C. Predict rupture life and the stress for a design life, compare with Sherby-Dorn and Manson-Haferd, and fit Norton's creep law (n and Q) from minimum creep rates. #849
- Laminate calculatorGet ply properties from fibre and matrix (rule of mixtures, Reuss or Halpin-Tsai), then use classical lamination theory for any stacking such as [0/±45/90]s: Q and Q-bar, the A, B and D matrices, effective laminate moduli, ply stresses and strains under in-plane forces and moments, and first-ply failure by maximum stress and Tsai-Wu. #850
Phase and thermal behaviour 2
- Diffusion calculatorWork out diffusion in solids with Fick's second law: the erfc profile under a constant surface concentration, a thin-film Gaussian source, or a diffusion couple. Get D from D₀ and Q at any temperature, the case depth for a target concentration, the time to reach a depth, the concentration profile plot, and an optional finite-difference check. #851
- Thermal mismatch stress calculatorWork out the stress from different thermal expansion: the biaxial stress in a thin film on a substrate, film stress from wafer bow or curvature with Stoney's equation, the curvature and layer stresses of a bonded bimetal strip (Timoshenko), and the stress in a bar held between walls. The CTE can change linearly with temperature. #852
Microscopy and image analysis 5
- Grain size by line interceptOpen an etched micrograph, calibrate the scale bar and lay test lines or circles over it. The page counts the grain boundaries along every line, lets you add or remove marks by tapping, and gives the mean lineal intercept, the ASTM grain size number G and a confidence interval. The image stays in your browser. #853
- Particle size from an imageOpen an SEM, TEM or optical image of particles, calibrate the scale bar and the page finds every particle: threshold, hole filling, a watershed split of touching particles, then area, equivalent diameter, Feret maximum and minimum, circularity and aspect ratio, with edge particles left out, a size histogram and D10, D50 and D90. The image stays in your browser. #854
- Phase fraction and porosityOpen a micrograph, split it into up to 4 phases by grey level (automatic Otsu or your own thresholds) or by colours you pick, and get each phase's area fraction and area, porosity, a point-count standard error and a field-to-field confidence interval, with a coloured overlay to check the split. The image stays in your browser. #855
- Lattice FFT and d-spacingOpen an HRTEM, STEM or AFM image of a lattice, set the scale and pick a square region. The page shows its power spectrum, finds the strongest spots and turns each into a d-spacing and angle (tap any spot to measure it), and makes a filtered image from the spots you choose. The image stays in your browser. #857
- AFM roughness analyserOpen AFM or profilometer height data as a text matrix, an x y z list or a 16-bit greyscale PNG or TIFF. Level it with a plane or polynomial (fitted to the whole image or a reference region) and line-by-line flattening, then get areal Sa, Sq, Ssk, Sku, Sz, profile Ra, Rq, Rsk, Rku, Rz, a dragged line profile, the step height between two regions, a height histogram and a colour map. #861
Nanoscience 3
- Nanoparticle calculatorFrom a particle's diameter, density and molar mass, get the surface-to-volume ratio, specific surface area in m²/g, atoms per particle and the share of atoms on the surface. Count atoms and corner, edge and face sites in magic-number cuboctahedral and icosahedral clusters, convert a mass concentration to particles per mL and nanomolar, and find the BET-equivalent diameter. #858
- DLS analyserPaste or open a DLS intensity autocorrelation g2(τ). Get the z-average diameter and polydispersity index by 2nd- or 3rd-order cumulants, and a regularised non-negative (CONTIN-like) size distribution by intensity, volume and number, from your wavelength, angle, refractive index, temperature and viscosity. #859
- Quantum dot size (Brus equation)Turn a quantum dot's first absorption peak or band gap into its size with the Brus equation, or a size into its gap and peak wavelength, using your own bulk gap, effective masses and dielectric constant. Shows the confinement and Coulomb terms, the exciton Bohr radius, a plot of gap against diameter, and an optional sizing curve of your own. #860
Semiconductors and electronics materials 4
- Carrier concentration and Fermi levelWork out the intrinsic carrier density, the electron and hole densities and the Fermi level of a doped semiconductor at any temperature. The band gap follows Varshni's formula, Nc and Nv come from your effective masses, and charge neutrality is solved with dopants that are only partly ionised, using the Fermi-Dirac integral so heavy doping is right too. Plots show the freeze-out, extrinsic and intrinsic regions. #862
- Tauc plot band gapOpen a UV-Vis spectrum and get the optical band gap from a Tauc plot: absorbance, transmittance or diffuse reflectance (Kubelka-Munk) turned into (αhν)^n for direct or indirect transitions, the straight part of the edge found for you or chosen by hand, the gap where the line meets zero or a baseline, with its error and window spread, plus the Urbach energy. #863
- Solar cell I-V analyserOpen or paste a solar cell's I-V curve and get the open-circuit voltage, short-circuit current and current density, maximum power point, fill factor and efficiency, series and shunt resistance from the slopes, and a single-diode model fit (solved exactly with the Lambert W function) for the ideality factor, saturation current, Rs and Rsh with standard errors. #864
- Thin-film thickness from fringesWork out a thin film's thickness from the interference fringes in its transmittance or reflectance spectrum: Swanepoel's envelope method gives the refractive index at every fringe and the thickness from whole-number orders; with a known index (constant or Cauchy) the fringe positions are enough; or count fringes between two wavelengths. #865
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